Improving input contrast estimation to an x-ray imaging system.

Phys Med Biol

Hospital Clínico Universitario Virgen de la Arrixaca-IMIB, ctra. Madrid-Cartagena, E-30120 El Palmar (Murcia), Spain.

Published: December 2023

An appropriate parameter to study the performance of an x-ray imaging system is contrast transfer, or the system's ability to capture contrast in the radiation beam and bring it to the image. However, determining the input contrast to the system is difficult, as it is heavily affected by secondary radiation, which in turn depends on a multitude of factors. This work presents a method to improve the calculation of input contrast to the imaging system when PMMA phantoms are used.An expression to obtain input contrast from primary radiation attenuation and scatter-to-primary ratio is shown, and the approximation upon which it is based is discussed. Primary and secondary radiation emerging from the phantoms are calculated for monoenergetic pencil beams impinging on planar PMMA phantoms of different thicknesses. Monte Carlo simulations of two types of anti-scatter grids are also incorporated into the calculations.The primary and secondary components of radiant energy and grid transmission factors are presented for monoenergetic beams with energies from 10 to 150 keV. These results are then used to calculate input contrast for polyenergetic beams when using a commercial image quality phantom combined with different thicknesses of PMMA and anti-scatter grids.The information of the object contrast carried by the beam constitutes the input to the imaging system. An accurate determination of this input contrast can be carried out in a wide variety of situations from the study of a reduced number of cases, as those presented in this work for monoenergetic beams, PMMA phantoms of different thicknesses and anti-scatter grids. The relationship between the input contrast and the contrast due to primary radiation used in this work provides a good approximation for the different combinations of inserts, phantoms, grids, and energy spectra analyzed here.

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Source
http://dx.doi.org/10.1088/1361-6560/ad0534DOI Listing

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