Among semiconductor metal oxides, that are an important class of sensing materials, titanium dioxide (TiO) thin films are widely employed as sensors because of their high chemical and mechanical stability in harsh environments, non-toxicity, eco-compatibility, and photocatalytic properties. TiO-based chemical oxygen demand (COD) sensors exploit the photocatalytic properties of TiO in inducing the oxidation of organic compounds to CO. In this work, we discuss nanostructured TiO thin films grown via low-pressure metal organic chemical vapor deposition (MOCVD) on metallic AISI 316 mesh. To increase the surface sensing area, different inorganic acid-based chemical etching protocols have been developed, determining the optimal experimental conditions for adequate substrate roughness. Both chemically etched pristine meshes and the MOCVD-coated ones have been studied by scanning electron microscopy (SEM), X-ray diffraction (XRD), energy dispersive X-ray (EDX) microanalysis, and X-ray photoelectron spectroscopy (XPS). We demonstrate that etching by HCl/HSO at 55 °C provides the most suitable surface morphology. To investigate the behavior of the developed high surface area TiO thin films as COD sensors, photocatalytic degradation of functional model pollutants based on ISO 10678:2010 has been tested, showing for the best performing acid-etched mesh coated with polycrystalline TiO an increase of 60% in activity, and degrading 66 µmol of MB per square meter per hour.

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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10574371PMC
http://dx.doi.org/10.3390/nano13192678DOI Listing

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