AI Article Synopsis
- The study reveals that off-axis optical rays in spatially resolved reflectance anisotropy (RA) spectrometers create unwanted signal components that standard optical alignment cannot fix, related to sample reflectivities.
- The nature of these spurious signals is complex and influenced by where the light hits the sample surface.
- A new data-reduction method using singular value decomposition is introduced to identify and eliminate these spurious signals, and the method was validated through an 8 × 8 multi-anode photomultiplier setup that enhances signal quality.
Article Abstract
We show that in spatially resolved reflectance anisotropy (RA) spectrometers, off-axis optical rays introduce a spurious signal component that cannot be addressed by optical alignment. Such a component is associated with the difference between the reflectivities s and p of the sample and depends, in a complex manner, on the incidence position of the incident light on the surface of the sample. We report a data-reduction procedure to easily identify and remove spurious RA signals associated with the off-axis optical rays, based on the singular value decomposition analysis of spatially resolved RA spectra. We validated this approach by developing a spatially resolved RA spectrometer based on an 8 × 8 multi-anode photomultiplier (PMT). The PMT allowed the use of phase-sensitive detection techniques to enhance the signal-to-noise ratio, which is essential for the evaluation of the proposed data reduction procedure.
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| http://dx.doi.org/10.1063/5.0162116 | DOI Listing |
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