Equation-Informed Neural Networks (EINNs) are developed as an efficient method for extracting the coefficients of constitutive equations. Subsequently, numerical Bayesian Inference (BI) iterations were applied to estimate the distribution of these coefficients, thereby further refining them. We could generate coefficients optimally aligned with the targeted application scenario by carefully adjusting pre-processing mapping parameters and identifying dataset preferences. Leveraging graphical representation techniques, the EINNs formulation is implemented in temperature- and strain-rate-dependent hyperbolic Garofalo, Anand, and Chaboche constitutive models to extract the corresponding coefficients for lead-free SAC305 solder material. The performance of the EINNs-based extracted coefficients, obtained from experimental results of SAC305 solder material, is comparable to existing studies. The methodology offers the dual advantage of providing the coefficients' value and distribution against the training dataset.
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http://dx.doi.org/10.3390/ma16144922 | DOI Listing |
Sci Rep
November 2024
Materials Center Leoben Forschung GmbH, Roseggerstraße 12, 8700, Leoben, Austria.
Low-melting metal alloys have gained renewed attention for additive manufacturing, energy storage and microelectronics. However, micro- and nanostructure characterisation demands highly sophisticated sample preparation. Here, we optimise the Ga-FIB preparation of atom probe tomography (APT) specimens for low melting SAC305 solder materials utilising different FESEM/FIB stage temperatures.
View Article and Find Full Text PDFMaterials (Basel)
November 2024
Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology, Chinese Academy of Sciences, Shenzhen 518055, China.
With the advancement of high-integration and high-density interconnection in chip manufacturing and packaging, Cu bumping technology in wafer- and panel- level packaging is developed to micrometer-sized structures and pitches to accommodate increased I/O numbers on high-end integrated circuits. Driven by this industrial demand, significant efforts have been dedicated to Cu electroplating techniques for improved pillar shape control and solder joint reliability, which substantially depend on additive formulations and electroplating parameters that regulate the growth morphology, crystal structure, and impurity incorporation in the process of electrodeposition. It is necessary to investigate the effect of an additive on Cu pillar electrodeposition, and to explore the Kirkendall voids formed during the reflowing process, which may result from the additive-induced impurity in the electrodeposited Cu pillars.
View Article and Find Full Text PDFPolymers (Basel)
September 2024
Joining and Welding Research Institute, Osaka University, Ibaraki 5670047, Japan.
Materials (Basel)
July 2024
Regional Industry Innovation Department (Growth Engine), Korea Institute of Industrial Technology, Incheon 21999, Republic of Korea.
In this study, we investigated the brittle fracture behavior of Sn-3.0Ag-0.5Cu (SAC305) solder joints with a Direct Electroless Gold (DEG) surface finish, formed using laser-assisted bonding (LAB) and mass reflow (MR) techniques.
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July 2024
Department of Materials Science and Engineering, Advanced Materials Processing and Analysis Center, University of Central Florida, Orlando, FL 32816, USA.
Bi-doped Sn-Ag-Cu (SAC) microelectronic solder is gaining attention for its utility as a material for solder joints that connect substrates to printed circuit boards (PCB) in future advanced packages, as Bi-doped SAC is reported to have a lower melting temperature, higher strength, higher wettability on conducting pads, and lower intermetallic compound (IMC) formation at the solder-pad interface. As solder joints are subjected to aging during their service life, an investigation of aging-induced changes in the microstructure and mechanical properties of the solder alloy is needed before its wider acceptance in advanced packages. This study focuses on the effects of 1 to 3 wt.
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