The Kβ/Kα X-ray intensity ratios of Cu and Ag in Cu-Ag thin alloy films.

Kβ/Kα X-ray intensity ratio values of Cu and Ag in CuAg (x = 53.5, 67.6, 76.9, 85.4, 89.6) thin alloy films produced from two different sources by the physical vapour deposition method have been determined by the Energy Dispersive X-ray Fluorescence Spectroscopy (EDXRF) method. The changes in the crystal structures of CuAg thin alloy films caused by the changes in the Cu and Ag concentrations, which affect the valence electronic structure have been investigated by the X-ray Diffraction (XRD) techniques. The obtained values were compared with the theoretical and fitted values for pure Cu and Ag elements.