AI Article Synopsis
- The paper discusses a new cryogenic sample chamber designed for low energy electron microscopy (LEEM) and shares initial experimental findings.
- Modifications were made to the LEEM instrument to enable cooling mechanisms and minimize heat load, achieving sample temperatures as low as 15 K using liquid nitrogen and helium.
- Initial low-temperature LEEM experiments on a three-monolayer pentacene film revealed a significant decrease in electron beam damage at lower temperatures and changes in the LEEM-IV spectra, with explanations provided for these observations.
Article Abstract
We describe a cryogenic sample chamber for low energy electron microscopy (LEEM), and present first experimental results. Modifications to our IBM/SPECS aberration-corrected LEEM instrument are presented first. These include incorporation of mechanisms for cooling the sample and its surroundings, and reduction of various sources of heat load. Using both liquid nitrogen and liquid helium, we have reached sample temperatures down to about 15 K. We also present first results for low-temperature LEEM, obtained on a three-monolayer pentacene film. Specifically, we observe a reduction of the electron beam irradiation damage cross-section at 15 eV by more than a factor of five upon cooling from 300 K down to 52 K. We also observe changes in the LEEM-IV spectra of the sample upon cooling, and discuss possible causes.
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| http://dx.doi.org/10.1016/j.ultramic.2023.113815 | DOI Listing |
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