Relaxor ferroelectrics (RFEs) are being actively investigated for energy-storage applications due to their large electric-field-induced polarization with slim hysteresis and fast energy charging-discharging capability. Here, a novel nanograin engineering approach based upon high kinetic energy deposition is reported, for mechanically inducing the RFE behavior in a normal ferroelectric Pb(Zr Ti )O (PZT), which results in simultaneous enhancement in the dielectric breakdown strength (E ) and polarization. Mechanically transformed relaxor thick films with 4 µm thickness exhibit an exceptional E of 540 MV m and reduced hysteresis with large unsaturated polarization (103.6 µC cm ), resulting in a record high energy-storage density of 124.1 J cm and a power density of 64.5 MW cm . This fundamental advancement is correlated with the generalized nanostructure design that comprises nanocrystalline phases embedded within the amorphous matrix. Microstructure-tailored ferroelectric behavior overcomes the limitations imposed by traditional compositional design methods and provides a feasible pathway for realization of high-performance energy-storage materials.
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http://dx.doi.org/10.1002/adma.202302554 | DOI Listing |
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