All-solution-processed perovskite light-emitting diodes (LEDs) have the potential to be inexpensive and easily manufactured on a large scale without requiring vacuum thermal deposition of the emissive and charge transport layers. Zinc oxide (ZnO), which possesses superior optical and electronic properties, is commonly used in all-solution-processed optoelectronic devices. However, the polar solvent of ZnO inks can corrode the perovskite layer and cause severe photoluminescence quenching. In this work, we report the successful dispersion of ZnO nanoparticles in nonpolar -octane by controlling the surface ligands from acetates to thiols. The nonpolar ink prevents the destruction of perovskite films. In addition, thiol ligands upshift the conduction band energy level, which also helps inhibit exciton quenching. Consequently, we demonstrate the fabrication of high-performance all-solution-processed green perovskite LEDs with a brightness of 21 000 cd/m and an external quantum efficiency of 6.36%. Our work provides a ZnO ink for fabricating efficient all-solution-processed perovskite LEDs.
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http://dx.doi.org/10.1021/acs.jpclett.3c01428 | DOI Listing |
ACS Nano
January 2024
Department of Electrical and Computer Engineering, Seoul National University, Seoul 08826, Republic of Korea.
Adv Mater
November 2023
SCNU-TUE Joint Lab of Device Integrated Responsive Materials (DIRM), National Center for International Research on Green Optoelectronics, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, P. R. China.
Circularly polarized (CP) coherent light sources are of great potential for various advanced optical applications spanning displays/imaging to data processing/encryption and quantum communication. Here, the first demonstration of CP amplified spontaneous emission (ASE)/lasing from a free-standing and flexible membrane device is reported. The membrane device consists of perovskite nanocrystals (PNCs) and cholesteric liquid crystals (CLCs) layers sandwiched within a Fabry-Pérot (F-P) cavity architecture.
View Article and Find Full Text PDFJ Phys Chem Lett
June 2023
State Key Laboratory of Silicon and Advanced Semiconductor Materials, Key Laboratory of Excited-State Materials of Zhejiang Province, Department of Chemistry, Zhejiang University, Hangzhou 310027, China.
All-solution-processed perovskite light-emitting diodes (LEDs) have the potential to be inexpensive and easily manufactured on a large scale without requiring vacuum thermal deposition of the emissive and charge transport layers. Zinc oxide (ZnO), which possesses superior optical and electronic properties, is commonly used in all-solution-processed optoelectronic devices. However, the polar solvent of ZnO inks can corrode the perovskite layer and cause severe photoluminescence quenching.
View Article and Find Full Text PDFNanotechnology
May 2023
School of Electronic Science and Engineering, Xiamen University, Xiamen 361005, People's Republic of China.
Last decades have witnessed the rapid development of ultraviolet (UV) photodetectors in diversity of applications. The III-nitride semiconductor and metal halide perovskite have both performed promising UV-sensing optoelectronic properties. However, they are still suffering from either the high temperature epitaxial-growth or low photocurrent generated in UV range.
View Article and Find Full Text PDFLight Sci Appl
April 2023
State Key Laboratory of Supramolecular Structure and Materials, College of Chemistry, Jilin University, Changchun, 130012, China.
Solution-processed organic‒inorganic halide perovskite (OIHP) single crystals (SCs) have demonstrated great potential in ionizing radiation detection due to their outstanding charge transport properties and low-cost preparation. However, the energy resolution (ER) and stability of OIHP detectors still lag far behind those of melt-grown inorganic perovskite and commercial CdZnTe counterparts due to the absence of detector-grade high-quality OIHP SCs. Here, we reveal that the crystallinity and uniformity of OIHP SCs are drastically improved by relieving interfacial stress with a facial gel-confined solution growth strategy, thus enabling the direct preparation of large-area detector-grade SC wafers up to 4 cm with drastically suppressed electronic and ionic defects.
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