Unveiling Atom Migration Abilities Affected Anode Performance of Sodium-Ion Batteries.

Angew Chem Int Ed Engl

State Key Laboratory of Physical Chemistry of Solid Surfaces, Collaborative Innovation Center of Chemistry for Energy Materials, College of Chemistry and Chemical Engineering, Xiamen University, Xiamen, 361005, P. R. China.

Published: July 2023

AI Article Synopsis

  • - The low initial coulombic efficiency (ICE) in sodium-ion batteries (SIBs) is primarily due to irreversible phase changes and challenges in removing sodium from transition metal compounds (TMCs).
  • - Research using in situ transmission electron microscopy and X-ray diffraction revealed that the poor reaction reversibility in NiCoP@C arises from the quick movement of phosphorus within the carbon layer and the selective formation of isolated sodium phosphorus during discharge.
  • - By modifying the carbon coating, the movement of Ni/Co/P atoms was slowed down, leading to better ICE and cycle stability, suggesting that this strategy could enhance performance across various electrode materials in sodium-ion batteries.

Article Abstract

In sodium-ion batteries (SIBs), the low initial coulombic efficiency (ICE) is commonly induced by irreversible phase conversion and difficult desodiation, especially on transition metal compounds (TMCs). Yet the underlying physicochemical mechanism of poor reaction reversibility is still a controversial issue. Herein, by using in situ transmission electron microscopy and in situ X-ray diffraction, we demonstrate the irreversible conversion of NiCoP@C is caused by the rapid migration of P in carbon layer and preferential formation of isolated Na P during discharge. By modifying the carbon coating layer, the migration of Ni/Co/P atoms is inhibited, thus the improvement of ICE and cycle stability is realized. The inhibiting of fast atom migration which induces component separation and rapid performance degradation might be applied to a wide range of electrode materials, and guides the development of advanced SIBs.

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Source
http://dx.doi.org/10.1002/anie.202303343DOI Listing

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