Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3122
Function: getPubMedXML
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
The perovskite buried interfaces have demonstrated pivotal roles in determining both the efficiency and stability of perovskite solar cells (PSCs); however, challenges remain in understanding and managing the interfaces due to their non-exposed feature. Here, we proposed a versatile strategy of pre-grafted halides to strengthen the SnO -perovskite buried interface by precisely manipulating perovskite defects and carrier dynamics through alteration of halide electronegativity (χ), thereby resulting in both favorable perovskite crystallization and minimized interfacial carrier losses. Specifically, the implementation of fluoride with the highest χ induces the strongest binding affinity to uncoordinated SnO defects and perovskite cations, leading to retarded perovskite crystallization and high-quality perovskite films with reduced residual stress. These improved properties enable champion efficiencies of 24.2% (the control: 20.5%) and 22.1% (the control: 18.7%) in rigid and flexible devices with extremely low voltage deficit down to 386 mV, all of which are among the highest reported values for PSCs with a similar device architecture. In addition, the resulting devices exhibit marked improvements in the device longevity under various stressors of humidity (>5000 h), light (1000 h), heat (180 h), and bending test (10 000 times). This method provides an effective way to improve the quality of buried interfaces toward high-performance PSCs.
Download full-text PDF |
Source |
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http://dx.doi.org/10.1002/adma.202300233 | DOI Listing |
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