Plasma-enhanced atomic layer deposition (PEALD) is utilized to improve the barrier properties of an organic chip-film patch (CFP) when it is used as an implant to prevent moisture and ions from migrating into the embedded electronic circuits. For this purpose, surface condition and material properties of eight modifications of AlO-TiO nanolaminates sequentially deposited on polyimide PI-2611 films are evaluated in detail. The effect of stress-induced warpage of the deposited AlO-TiO on the wafer level is calculated with the Stoney equation and reveals higher tensile stress values while increasing the thickness of AlO-TiO nanolaminates from 20 up to 80 nm. Contact angle measurement and atomic force microscopy are used to investigate the surface energy and wettability, as well as the surface morphology of polyimide-AlO-TiO interfaces. We show that plasma treatment of pristine polyimide leads to an enhanced adhesion force of the PEAL-deposited layer by a factor of 1.3. The water vapor transmission rate (WVTR) is determined by exposing the coated polyimide films to 85% humidity and 23 °C and yields down to 1.58 × 10 g(HO)/(m d). The data obtained are compared with alternative coating processes using the polymers parylene-C and benzocyclobutene (BCB). The latter shows higher WVTR values of 1.2 × 10 and 1.7 × 10 g(HO)/(m d) compared to the PEALD-PI-2611 systems, indicating lower barrier properties. Two AlO-TiO modifications with low WVTR values have been chosen for encapsulating the CFP substrates and exposing them in a long-time experiment to chemical and mechanical loads in a chamber filled with phosphate-buffered saline at 37 °C, pH 7.3, and a cyclically applied pressure of 160 mbar (∼120 mm Hg). The electrical leakage behavior of the CFP systems is measured and reveals reliable electrical long-term stability far beyond 11 months, highlighting the great potential of PEALD-encapsulated CFPs.
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| http://dx.doi.org/10.1021/acsami.2c22513 | DOI Listing |
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Article Synopsis
- A new inorganic multilayer barrier film was created on polyethylene naphthalate (PEN) using advanced deposition techniques, combining a SiO layer from ICP-CVD and an AlO/ZnO nanolaminate from PEALD.
- The resulting film has impressive optical transmittance of 88.1% and low water vapor permeability of 3.3 × 10 g/m/day, demonstrating effective collaboration between the two growth methods.
- The study indicates that the PEALD layer repairs defects in the SiO layer and the multilayer structure enhances performance, making it suitable for long-lasting organic electronic device encapsulation.
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