Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 1034
Function: getPubMedXML
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3152
Function: GetPubMedArticleOutput_2016
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
In this article we show results on cavity-free lasing in nitrogen filaments using our 3D, time-dependent Maxwell-Bloch code, Dagon. This code was previously used to model plasma-based soft X-ray lasers and it has been adapted to model lasing in nitrogen plasma filaments. In order to assess the predictive capabilities of the code, we have conducted several benchmarks against experimental and 1D modelling results. Afterwards, we study the amplification of an externally seeded UV beam in nitrogen plasma filaments. Our results show that the phase of the amplified beam carries information about the temporal dynamics of amplification and collisional processes inside the plasma, along with information about the spatial structure of the amplified beam and the active region of the filament. We thus conclude that measuring the phase of an UV probe beam, in combination with 3D Maxwell-Bloch modelling, might be an excellent method for diagnosing electron density value and gradients, mean ionization, density of 2+ ions and the magnitude of collisional processes inside these filaments.
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Source |
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http://dx.doi.org/10.1364/OE.478100 | DOI Listing |
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