AI Article Synopsis

  • The study introduces a cost-effective, non-lithographic method to create hierarchical aluminum (Al) nanopit arrays for detecting refractive index (RI) in the deep ultraviolet (DUV) range (200-300 nm).
  • By varying the thickness of Al deposition, the nanopit arrays exhibit adjustable plasmonic properties, achieving high RI sensitivity (311 nm/RIU) and a low detection limit for adenine ethanol solution (5×10^-6 M).
  • The strong sensing performance is attributed to local surface plasmon resonance, indicating a promising approach for developing efficient Al-based RI sensors in the DUV spectrum.

Article Abstract

Herein, we proposed a simple non-lithographic way to fabricate hierarchical Al nanopit arrays performed as deep ultraviolet (DUV, 200-300 nm) refractive index sensing. Only by adjusting the Al deposition thickness on the Al nanopit array, the hierarchical Al nanopit arrays with tunable plasmonic properties in the DUV region were obtained. The prepared hierarchical Al nanopit arrays are of very good time stability and its RI sensitivity and concentration detection limit of adenine ethanol solution reach 311 nm/RIU and5×10-6M,respectively, as the Al deposition thickness is 60 nm. Furthermore, the electric field distribution simulation results show that high RI sensing characteristic are mainly attributed to the local surface plasmon resonance. This investigation provides a facile way to develop low cost, high efficient and easily fabricated Al-based RI sensor in the DUV region.

Download full-text PDF

Source
http://dx.doi.org/10.1088/1361-6528/aca7ccDOI Listing

Publication Analysis

Top Keywords

hierarchical nanopit
16
nanopit arrays
16
deep ultraviolet
8
refractive sensing
8
deposition thickness
8
duv region
8
nanopit
5
low-cost simple
4
simple fabrication
4
hierarchical
4

Similar Publications

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!