head blight (FHB), is one of the destructive fugue diseases of wheat worldwide caused by the (). In this study, a population consisting of 262 recombinant inbred lines (RILs) derived from Zhongmai 578 and Jimai 22 was used to map Quantitative Trait Locus (QTL) for FHB resistance, with the genotype data using the wheat 50 K single nucleotide polymorphism (SNP) array. The percentage of symptomatic spikelet (PSS) and the weighted average of PSS (PSSW) were collected for each RIL to represent their resistance to wheat head blight caused by . In total, 22 QTL associated with FHB resistance were identified on chromosomes 1D, 2B, 3B, 4A, 5D, 7A, 7B, and 7D, respectively, from which 10 and 12 QTL were detected from PSS and PSSW respectively, explaining 3.82%-10.57% of the phenotypic variances using the inclusive composite interval mapping method. One novel QTL, , was identified, explaining 10.56% of the phenotypic variation. One stable QTL, was detected on chromosome 1D across multiple environments explaining 4.39%-5.70% of the phenotypic variation. Forty-seven candidate genes related to disease resistance were found in the interval of and . Genomic prediction accuracies were estimated from the five-fold cross-validation scheme ranging from 0.34 to 0.40 for PSS, and from 0.34 to 0.39 for PSSW in inoculation treatment. This study provided new insight into the genetic analysis of resistance to wheat head blight caused by , and genomic selection (GS) as a potential approach for improving the resistance of wheat head blight.

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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9638129PMC
http://dx.doi.org/10.3389/fgene.2022.1039841DOI Listing

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