The optical properties of various PEDOT:PSS films obtained by drop casting and blade coating are analyzed by variable-angle spectroscopic ellipsometry in the visible-UV spectral range. We discuss observed differences in the optical spectra due to PSS content and DMSO treatment and correlate them to structural changes extracted from Raman measurements. In particular, we investigate the optical anisotropy of the complex refractive indices which arises from the in-plane arrangement of the PEDOT backbones, giving rise to optically uniaxial behavior with the optic axis perpendicular to the film plane. Although this is widely accepted, most investigations disregard the anisotropy for simplicity, which sometimes leads to inaccurate conclusions. In this work, we compare the results of isotropic and anisotropic analyses to clarify which kind of errors we can expect if anisotropy is not considered. Finally, the correlation between Raman scattering and ellipsometric analyses shows that not only local structural changes of the chain conformation but also the overall morphology of the composite films are significant in the interpretation of Raman spectra.
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http://dx.doi.org/10.1021/acsomega.2c05945 | DOI Listing |
J Colloid Interface Sci
December 2024
Biological Physics Laboratory, Department of Physics and Astronomy, University of Manchester, Oxford Road, Schuster Building, Manchester M13 9PL, UK. Electronic address:
Hypothesis: Bioengineered monoclonal antibodies (mAbs) have gained significant recognition as medical therapies. However, during processing, storage and use, mAbs are susceptible to interfacial adsorption and desorption, leading to structural deformation and aggregation, and undermining their bioactivity. To suppress antibody surface adsorption, nonionic surfactants are commonly used in formulation.
View Article and Find Full Text PDFNanomaterials (Basel)
January 2025
Department of Physics, Kyung Hee University, Seoul 02447, Republic of Korea.
We report the complex dielectric function = + of MoS/WS and WS/MoS heterostructures and their constituent monolayers MoS and WS for an energy range from 1.5 to 6.0 eV and temperatures from 39 to 300 K.
View Article and Find Full Text PDFMicromachines (Basel)
December 2024
School of Physics, Changchun University of Science and Technology, Changchun 130012, China.
Tungsten oxide (WO) electrochromic devices are obtaining increasing interest due to their color change and thermal regulation. However, most previous work focuses on the absorption or transmission spectra of materials, rather than the optical parameters evolution in full spectrum in the electrochromic processes. Herein, we developed a systematic protocol of ex situ methods to clarify the evolutions of subtle structure changes, Raman vibration modes, and optical parameters of WO thin films in electrochromic processes as stimulated by dosage-dependent Li insertion.
View Article and Find Full Text PDFMaterials (Basel)
December 2024
Department of Optical Science and Engineering, Shanghai Ultra-Precision Optical Manufacturing Engineering Center, Fudan University, Shanghai 200433, China.
In recent years, the fabrication of materials with large nonlinear optical coefficients and the investigation of methods to enhance nonlinear optical performance have been in the spotlight. Herein, the bismuth telluride (BiTe) thin films were prepared by radio-frequency magnetron sputtering and annealed in vacuum at various temperatures. The structural and optical properties were characterized and analyzed using X-ray diffraction, scanning electron microscopy, X-ray photoelectron spectroscopy, spectroscopic ellipsometry, and UV/VIS/NIR spectrophotometry.
View Article and Find Full Text PDFSci Rep
January 2025
Department of Graphic Arts and Photophysics, Faculty of Chemical Technology, University of Pardubice, Studentská 573, Pardubice, 532 10, Czech Republic.
Radio frequency magnetron co-sputtering method employing GeTe and Sc targets was exploited for the deposition of Sc doped GeTe thin films. Different characterization techniques (scanning electron microscopy with energy-dispersive X-ray analysis, X-ray diffraction, atomic force microscopy, sheet resistance temperature-dependent measurements, variable angle spectroscopic ellipsometry, and laser ablation time-of-flight mass spectrometry) were used to evaluate the properties of as-deposited (amorphous) and annealed (crystalline) Ge-Te-Sc thin films. Prepared amorphous thin films have GeTe, GeTeSc, GeTeSc, GeTeSc and GeTeSc chemical composition.
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