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Mapping structure heterogeneities and visualizing moisture degradation of perovskite films with nano-focus WAXS. | LitMetric

AI Article Synopsis

  • Research has largely concentrated on optimizing perovskite structures, but little has been done to study the structural variations within mixed hybrid perovskite films, especially how these variations change with depth.
  • The team used a specialized X-ray scattering technique to analyze these depth-related structural heterogeneities, discovering that the top layer of the film experiences tensile strain.
  • They also found that moisture degradation occurs primarily at the film's surface and grain boundaries, with the observed tensile strain affecting how this degradation progresses.

Article Abstract

Extensive attention has focused on the structure optimization of perovskites, whereas rare research has mapped the structure heterogeneity within mixed hybrid perovskite films. Overlooked aspects include material and structure variations as a function of depth. These depth-dependent local structure heterogeneities dictate their long-term stabilities and efficiencies. Here, we use a nano-focused wide-angle X-ray scattering method for the mapping of film heterogeneities over several micrometers across lateral and vertical directions. The relative variations of characteristic perovskite peak positions show that the top film region bears the tensile strain. Through a texture orientation map of the perovskite (100) peak, we find that the perovskite grains deposited by sequential spray-coating grow along the vertical direction. Moreover, we investigate the moisture-induced degradation products in the perovskite film, and the underlying mechanism for its structure-dependent degradation. The moisture degradation along the lateral direction primarily initiates at the perovskite-air interface and grain boundaries. The tensile strain on the top surface has a profound influence on the moisture degradation.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9637205PMC
http://dx.doi.org/10.1038/s41467-022-34426-yDOI Listing

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