High-resolution X-ray imaging diagnosis is a critical method for measuring Rayleigh-Taylor instability growth and hot spot interface morphology in inertial confinement fusion experiments. In this study, we develop a quasi-monochromatic elliptical Kirkpatrick-Baez microscope based on aberration theory, breaking the aberration limit of conventional Kirkpatrick-Baez microscopes. The microscope was characterized in the laboratory for spatial resolution performance and modulation transfer function before being implemented in cavity experiments at the SG-III prototype laser facility. The results demonstrate that the edge-based method achieves a spatial resolution of <2 µm in the central field of view and modulation of 800 lp/mm spatial frequency of >20%.

Download full-text PDF

Source
http://dx.doi.org/10.1364/OE.463502DOI Listing

Publication Analysis

Top Keywords

elliptical kirkpatrick-baez
8
kirkpatrick-baez microscope
8
spatial resolution
8
high-resolution elliptical
4
microscope implosion
4
implosion higher-mode
4
higher-mode instability
4
instability diagnosis
4
diagnosis high-resolution
4
high-resolution x-ray
4

Similar Publications

General guide concepts for compact, high-brilliance neutron moderators.

Rev Sci Instrum

July 2024

Second Target Station, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.

The trend in neutron sciences is toward integrating compact, high-brightness moderators into new or upgraded facilities. Transporting neutrons from the source to the sample position with a phase-space distribution tailored to specific requirements is crucial to leverage high source brilliance. We have investigated four guide concepts using Monte Carlo ray tracing simulations: Montel beamline with nested Kirkpatrick-Baez mirrors, curved-tapered beamline with a bender and straight sections, straight-elliptical beamline, and curved-elliptical beamline.

View Article and Find Full Text PDF

Wavefront analysis and phase correctors design using SHADOW.

J Synchrotron Radiat

May 2024

Diamond Light Source, Harwell Science and Innovation Campus, Didcot OX11 0DE, United Kingdom.

Knife-edge imaging is a successful method for determining the wavefront distortion of focusing optics such as Kirkpatrick-Baez mirrors or compound refractive lenses. In this study, the wavefront error of an imperfect elliptical mirror is predicted by developing a knife-edge program using the SHADOW/OASYS platform. It is shown that the focusing optics can be aligned perfectly by minimizing the parabolic and cubic coefficients of the wavefront error.

View Article and Find Full Text PDF
Article Synopsis
  • The study examines the limitations of Kirkpatrick-Baez (KB) mirrors used for X-ray focusing, particularly how they can cause focus expansion and severe coma aberration due to not meeting the Abbe sine condition.
  • Researchers propose ultracompact KB (ucKB) mirrors, which require shorter focal lengths and mirror lengths to achieve a larger numerical aperture while minimizing aberrations.
  • Simulations combining ray tracing and wave propagation show that ucKB mirrors maintain diffraction-limited focusing and reduce rotation errors, and these findings are supported by synchrotron radiation experiments, indicating their potential for soft-X-ray nanoprobes.
View Article and Find Full Text PDF

High-resolution X-ray imaging diagnosis is a critical method for measuring Rayleigh-Taylor instability growth and hot spot interface morphology in inertial confinement fusion experiments. In this study, we develop a quasi-monochromatic elliptical Kirkpatrick-Baez microscope based on aberration theory, breaking the aberration limit of conventional Kirkpatrick-Baez microscopes. The microscope was characterized in the laboratory for spatial resolution performance and modulation transfer function before being implemented in cavity experiments at the SG-III prototype laser facility.

View Article and Find Full Text PDF

Focal shift induced by source displacements and optical figure errors.

J Synchrotron Radiat

September 2019

Elettra-Sincrotrone Trieste SCpA, SS 14 - km 163.5, 34149 Basovizza, Trieste Italy.

In this work the longitudinal shifts of the focal plane of an ellipsoidal mirror induced by longitudinal shifts of the source and by the optical figure error of the mirror itself are investigated. The case of an ideal mirror illuminated by a Gaussian beam is considered first, deriving an analytical formula predicting the source-to-focus shift. Then the realistic case of a mirror affected by surface shape defects is examined, by taking into account metrological data and numerically solving the Huygens-Fresnel integral.

View Article and Find Full Text PDF

Want AI Summaries of new PubMed Abstracts delivered to your In-box?

Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!