Light-field microscopy represents a promising solution for microscopic volumetric imaging, thanks to its capability to encode information on multiple planes in a single acquisition. This is achieved through its peculiar simultaneous capture of information on light spatial distribution and propagation direction. However, state-of-the-art light-field microscopes suffer from a detrimental loss of spatial resolution compared to standard microscopes. In this article, we experimentally demonstrate the working principle of a new scheme, called Correlation Light-field Microscopy (CLM), where the correlation between two light beams is exploited to achieve volumetric imaging with a resolution that is only limited by diffraction. In CLM, a correlation image is obtained by measuring intensity correlations between a large number of pairs of ultra-short frames; each pair of frames is illuminated by the two correlated beams, and is exposed for a time comparable with the source coherence time. We experimentally show the capability of CLM to recover the information contained in out-of-focus planes within three-dimensional test targets and biomedical phantoms. In particular, we demonstrate the improvement of the depth of field enabled by CLM with respect to a conventional microscope characterized by the same resolution. Moreover, the multiple perspectives contained in a single correlation image enable reconstructing over 50 distinguishable transverse planes within a 1 mm sample.
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http://dx.doi.org/10.1038/s41598-022-21240-1 | DOI Listing |
Sci Adv
January 2025
Guangdong Provincial Key Laboratory of Optical Fiber Sensing and Communications, Institute of Photonics Technology, Jinan University, Guangzhou 510632, China.
Artificial nanostructures with ultrafine and deep-subwavelength features have emerged as a paradigm-shifting platform to advanced light-field management, becoming key building blocks for high-performance integrated optoelectronics and flat optics. However, direct optical inspection of integrated chips remains a missing metrology gap that hinders quick feedback between design and fabrications. Here, we demonstrate that photothermal nonlinear scattering microscopy can be used for direct imaging and resolving of integrated optoelectronic chips beyond the diffraction limit.
View Article and Find Full Text PDFFront Bioeng Biotechnol
November 2024
College of Energy and Power Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China.
Deep learning is progressively emerging as a vital tool for image reconstruction in light field microscopy. The present review provides a comprehensive examination of the latest advancements in light field image reconstruction techniques based on deep learning algorithms. First, the review briefly introduced the concept of light field and deep learning techniques.
View Article and Find Full Text PDFLight-field imaging is widely used in many fields, such as computer vision, graphics, and microscopy imaging, to record high-dimensional light information for abundant visual perception. However, light-field imaging systems generally have high system complexity and limited resolution. Over the last decades, lensless imaging systems have attracted tremendous attention to alleviate the restrictions of lens-based architectures.
View Article and Find Full Text PDFFluorescence microscopy has significantly advanced biological imaging at the nanoscale, particularly with the advent of super-resolution microscopy (SRM), which transcends the Abbe diffraction limit. Most cutting-edge SR methods require high-precision optical setups, which constrain the widespread adoption of SRM. Fluorescence fluctuation-based SRM (FF-SRM) can break the diffraction limit without complex optical components, making it particularly well-suited for biological imaging.
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