Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3122
Function: getPubMedXML
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
A graphene-based terahertz negative-conductivity metasurface based on two types of unit cell structures is investigated under the control of an external bias voltage. Electrical characterization is conducted and verification is performed using a finite-difference time-domain (FDTD) and an optical-pump terahertz (THz)-probe system in terms of simulation and transient response analysis. Owing to the metal-like properties of graphene, a strong interaction between the metasurface and monolayer graphene yields a short-circuit effect, which considerably weakens the intensity of the resonance mode under passive conditions. Under active conditions, graphene, as an active load, actively induces a negative-conductivity effect, which enhances the THz transmission and recovers the resonance intensity gradually because of the weakening of the short-circuit effect. The resulting resonance frequency shows a blue shift. This study provides a reference value for combining graphene exhibiting the terahertz bias-driven negative-conductivity effect with metasurfaces and its corresponding applications in the future.
Download full-text PDF |
Source |
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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9417548 | PMC |
http://dx.doi.org/10.1039/d2na00288d | DOI Listing |
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