Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution.

J Med Imaging (Bellingham)

Illinois Institute of Technology, ECE/BME Department, Chicago, Illinois, United States.

Published: May 2022

JMI guest editors introduce articles collected in the JMI Special Section on Hard X-Ray Tomography with Micrometer Resolution, a snapshot of this important niche area featured by hard x-ray tomography at the micrometer level.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9243520PMC
http://dx.doi.org/10.1117/1.JMI.9.3.031501DOI Listing

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