Real-time and in situ monitoring of organosilicon-induced thiram penetration into cabbage leaves by surface-enhanced Raman scattering mapping.

Background: Understanding pesticide penetration behavior is important for effective application of pesticides. However, there is a lack of an effective method to monitor pesticide penetration behavior and its changing process. In the present study, a novel surface-enhanced Raman scattering (SERS) mapping method was used for real-time and in situ tracking of the penetration behaviors of thiram and thiram-organosilicon mixture on cabbage leaves.

Results: The results suggest that thiram has very weak ability to penetrate into cabbage leaves. However, when the thiram-organosilicon mixture was placed on leaf surfaces, a clear thiram signal was detected inside the leaf after 2 h of exposure, a strong signal was observed after 12 h, and the penetration depth of thiram was approximately 200 μm after 48 h.

Conclusion: SERS mapping was demonstrated to be a reliable method for in situ monitoring of organosilicon-induced thiram penetration into cabbage leaf over time. The present study provides a new reference for rationally selecting adjuvants, effectively applying pesticides, and reducing pesticides residue in food. © 2022 Society of Chemical Industry.