Electron ptychography has been implemented in Scanning Transmission Electron Microscopy (STEM) to study materials with higher spatial resolution. High electron dose imposed by data redundancy requirement in electron ptychography is detrimental to the samples well-suited for ptychography, i.e., thin samples. In this work, we demonstrate a smart (Moiré) sampling strategy which allows dose reduction by orders of magnitude on periodic crystalline samples.
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Atomically resolved imaging of radiation-sensitive metal-organic frameworks via electron ptychography.
Nat Commun
January 2025
Center for Electron Microscopy, South China University of Technology, Guangzhou, China.
Electron ptychography, recognized as an ideal technique for low-dose imaging, consistently achieves deep sub-angstrom resolution at electron doses of several thousand electrons per square angstrom (e/Å) or higher. Despite its proven efficacy, the application of electron ptychography at even lower doses-necessary for materials highly sensitive to electron beams-raises questions regarding its feasibility and the attainable resolution under such stringent conditions. Herein, we demonstrate the implementation of near-atomic-resolution ( ~ 2 Å) electron ptychography reconstruction at electron doses as low as ~100 e/Å, for metal-organic frameworks (MOFs), which are known for their extreme sensitivity.
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Department of Materials Science and Engineering, School of Materials and Chemical Technologies, Institute of Science Tokyo, 4259 Nagatsuta, Midoriku, Yokohama 226-8503, Japan. Electronic address:
Scanning transmission electron microscopy (STEM) provides high-resolution visualization of atomic structures as well as various functional imaging modes utilizing phase contrasts. In this study we introduce a semicircular aperture in STEM bright field imaging, which gives a phase contrast transfer function that becomes complex and includes both lower and higher spatial frequency contrast transfer. This approach offers significant advantages over conventional phase plate methods, having no charge accumulation, degradation, or unwanted background noise, which are all problematic in the phase plate material.
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EMAT, University of Antwerp, Groenenborgerlaan 171 2020, Antwerp, Belgium.
The challenge of imaging low-density objects in an electron microscope without causing beam damage is significant in modern transmission electron microscopy. This is especially true for life science imaging, where the sample, rather than the instrument, still determines the resolution limit. Here, we explore whether we have to accept this or can progress further in this area.
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Institute of Scientific Instruments of the Czech Academy of Sciences, Kralovopolska 147, 61200 Brno, Czech Republic.
Phase contrast imaging is well-suited for studying weakly scattering samples. Its strength lies in its ability to measure how the phase of the electron beam is affected by the sample, even when other imaging techniques yield low contrast. In this study, we explore via simulations two phase contrast techniques: integrated center of mass (iCOM) and ptychography, specifically using the extended ptychographical iterative engine (ePIE).
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Nature
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Department of Physics and Astronomy, University of California, Los Angeles, Los Angeles, CA, USA.
Microscopy and crystallography are two essential experimental methodologies for advancing modern science. They complement one another, with microscopy typically relying on lenses to image the local structures of samples, and crystallography using diffraction to determine the global atomic structure of crystals. Over the past two decades, computational microscopy, encompassing coherent diffractive imaging (CDI) and ptychography, has advanced rapidly, unifying microscopy and crystallography to overcome their limitations.
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