Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 1034
Function: getPubMedXML
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3152
Function: GetPubMedArticleOutput_2016
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Electroactive polymers (EAPs) such as P(VDF-TrFE-CTFE) are very promising in the field of flexible sensors and actuators. Their advantages in smart electrical devices are due to their low cost, elastic properties, low density, and ability to be manufactured into various shapes and thicknesses. In earlier years, terpolymer P(VDF-TrFE-CTFE) attracted a lot of research due to its relaxor-ferroelectric property that exhibits high electrostriction phenomena. While widely used in flexible actuation, this class of material is still limited by the high electric fields required (≥30 V μm) to achieve sufficient strain levels (>2%). This inevitably leads to high levels of leakage current and thus a short lifetime. This paper proposes a new approach based on electro-annealing thermal treatment for a pure terpolymer P(VDF-TrFE-CTFE) matrix in order to limit the conduction mechanisms. This in turn reduces the dielectric losses at a high level of electric fields. The experimental results demonstrate that a huge decrease in leakage current of 80% is achieved for a wide range of electric fields ( up to 90 V μm) with a 4-fold extension in time-to-breakdown at high voltage excitations of 40 V μm.
Download full-text PDF |
Source |
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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC9063747 | PMC |
http://dx.doi.org/10.1039/c9ra01469a | DOI Listing |
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