The ongoing trend in the development of powerful ultrashort pulse lasers has attracted increasing attention for this technology to be applied in large-scale surface engineering and modern microfabrication. However, the emission of undesired X-ray photon radiation was recently reported even for industrially relevant laser irradiation regimes, causing serious health risks for laser operators. In the meantime, more than twenty influencing factors have been identified with substantial effects on X-ray photon emission released by ultrashort pulse laser processes. The presented study on enhanced X-ray emission arising from high pulse repetition frequency ultrashort pulse laser processing provides new insights into the interrelation of the highest-contributing parameters. It is verified by the example of AISI 304 substrates that X-ray photon emission can considerably exceed the legal dose rate limit when ultrashort laser pulses with peak intensities below 1 × 10 W/cm² irradiate at a 0.5 MHz pulse repetition frequency. The peak intensity threshold value for X-ray emissions decreases with larger laser spot sizes and longer pulse durations. Another key finding of this study is that the suction flow conditions in the laser processing area can affect the released X-ray emission dose rate. The presented results support the development of effective X-ray protection strategies for safe and risk-free ultrashort pulse laser operation in industrial and academic research applications.
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http://dx.doi.org/10.3390/ma15082748 | DOI Listing |
Nano Lett
January 2025
Regensburg Center for Ultrafast Nanoscopy (RUN) and Department of Physics, University of Regensburg, 93040 Regensburg, Germany.
Detecting electromagnetic radiation scattered from a tip-sample junction has enabled overcoming the diffraction limit and started the flourishing field of polariton nanoimaging. However, most techniques only resolve amplitude and relative phase of the scattered radiation. Here, we utilize field-resolved detection of ultrashort scattered pulses to map the dynamics of surface polaritons in both space and time.
View Article and Find Full Text PDFJ Chem Theory Comput
January 2025
State Key Laboratory for Mesoscopic Physics and Collaborative Innovation Center of Quantum Matter, School of Physics, Peking University, Beijing 100871, China.
ACS Appl Mater Interfaces
January 2025
College of Optical, Mechanical and Electrical Engineering, Zhejiang A&F University, Lin'an 311300, China.
As a member of the chalcogenide family, NiSe exhibits a direct bandgap of 1.74 eV, making it a promising candidate for nonlinear optical devices. However, its potential in the near-infrared region of the telecommunication band has not been fully explored.
View Article and Find Full Text PDFLight Sci Appl
January 2025
Russell Centre for Advanced Lightwave Science, Shanghai Institute of Optics and Fine Mechanics and Hangzhou Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China.
Continuous-wave mode-locking at multi-GHz repetition rates is achieved in an ultrashort laser cavity at critical pulse energies 100 times lower than predicted by conventional theory. The authors reveal that dynamic gain depletion and recovery between consecutive round-trips is the key factor behind a low-pulse-energy transition from Q-switched mode-locking (QSML) to continuous-wave mode-locking (CWML). As well as providing new insight into gain dynamics, the results suggest a practical route to low-threshold lasing at very high-repetition rates.
View Article and Find Full Text PDFWe theoretically investigate the impact of nonlinear dispersion of crystals and multilayers used in Laue-type pulse compressors (LPCs) on chirped x-ray pulse compression, as well as the optimization method for the configuration of LPCs. We also study the application of LPCs to compress chirped x-ray free-electron laser pulses based on the parameters of LCLS-II-HE. The results show that the optimal thickness is half of the Pendellosung period, yielding the best compressor performance with minimal impact from the nonlinear dispersion.
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