AI Article Synopsis
- Doped semiconductor nanocrystal thin films are used in various applications like screens, electrochromic windows, LEDs, and solar cells.
- Spectroscopic ellipsometry was used to assess and model the dielectric properties of indium tin oxide films created through nanocrystal deposition and sintering.
- The modeling indicates that the films can be analyzed as Bruggemann effective media, which helps estimate their nanoscale porosity and suggests that the dielectric constants can be adjusted to manipulate plasma frequency and other properties.
Article Abstract
Doped semiconductor nanocrystal-based thin films are widely used for many applications, such as screens, electrochromic windows, light emitting diodes, and solar cells. Herein, we have employed spectroscopic ellipsometry to measure and model the complex dielectric response of indium tin oxide films fabricated by nanocrystal deposition and sintering. The films could be modelled as Bruggemann effective media, allowing estimation of the nanoscale interstitial porosity of the structure. The effective dielectric constants show the possibility of tuning the plasma frequency and the epsilon-near zero condition of the film.
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| http://dx.doi.org/10.1039/d1cp05897e | DOI Listing |
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