AI Article Synopsis
- Four-beam diffraction (4BD) is only activated by a specific photon energy and angle of incidence, making it useful for precise calibration of X-ray energies and beam positions.
- The forbidden-reflection 4BD pattern resembles an X-shaped cross and can be captured instantly without moving the crystal.
- A high-resolution monitoring system for beam and source positions is proposed, which can be applied to synchrotron light sources, X-ray free-electron lasers, and nano-focused X-ray sources.
Article Abstract
Rigorous dynamical theory calculations show that four-beam diffraction (4BD) can be activated only by a unique photon energy and a unique incidence direction. Thus, 4BD may be used to precisely calibrate X-ray photon energies and beam positions. Based on the principles that the forbidden-reflection 4BD pattern, which is typically an X-shaped cross, can be generated by instant imaging using the divergent beam from a point source without rocking the crystal, a detailed real-time high-resolution beam (and source) position monitoring scheme is illustrated for monitoring two-dimensional beam positions and directions of modern synchrotron light sources, X-ray free-electron lasers and nano-focused X-ray sources.
Download full-text PDF |
Source |
|---|---|
| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8733982 | PMC |
| http://dx.doi.org/10.1107/S1600577521012352 | DOI Listing |
Publication Analysis
Top Keywords
Similar Publications
Utilizing a Diffractive Focus Beam Shaper to Enhance Pattern Uniformity and Process Throughput during Direct Laser Interference Patterning.
Materials (Basel)
January 2022
Institute for Manufacturing Technology, Technische Universität Dresden, George-Baehr-Str. 3c, 01069 Dresden, Germany.
Uniform periodic microstructure formation over large areas is generally challenging in Direct Laser Interference Patterning (DLIP) due to the Gaussian laser beam intensity distribution inherent to most commercial laser sources. In this work, a diffractive fundamental beam-mode shaper (FBS) element is implemented in a four-beam DLIP optical setup to generate a square-shaped top-hat intensity distribution in the interference volume. The interference patterns produced by a standard configuration and the developed setup are measured and compared.
View Article and Find Full Text PDFX-ray beam monitoring and wavelength calibration using four-beam diffraction.
J Synchrotron Radiat
January 2022
Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Lemont, IL 60439, USA.
Article Synopsis
- Four-beam diffraction (4BD) is only activated by a specific photon energy and angle of incidence, making it useful for precise calibration of X-ray energies and beam positions.
- The forbidden-reflection 4BD pattern resembles an X-shaped cross and can be captured instantly without moving the crystal.
- A high-resolution monitoring system for beam and source positions is proposed, which can be applied to synchrotron light sources, X-ray free-electron lasers, and nano-focused X-ray sources.
Improving the homogeneity of diffraction based colours by fabricating periodic patterns with gradient spatial period using Direct Laser Interference Patterning.
Sci Rep
May 2019
Institut für Fertigungstechnik, Technische Universität Dresden, George-Baehr-Str. 3c, 01069, Dresden, Germany.
This study focuses on the development of a strategy to produce periodic structures with a variable spatial period for increasing the homogeneity of structural colours by means of direct laser interference patterning. Using a four-beam interference configuration, hole-like periodic arrays are produced on stainless steel with a 70 ps pulsed laser source operating at 532 nm laser wavelength. The laser processing parameters are optimised for obtaining patterns with the highest possible diffraction efficiency and thus showing the highest possible colour intensity.
View Article and Find Full Text PDFAn accurate theory of X-ray coplanar multiple SRMS diffractometry.
Acta Crystallogr A Found Adv
November 2018
National Research Centre `Kurchatov Institute', Kurchatov square 1, 123182 Moscow, Russia.
The article reports an accurate theory of X-ray coplanar multiple diffraction for an experimental setup that consists of a generic synchrotron radiation (SR) source, double-crystal monochromator (M) and slit (S). It is called for brevity the theory of X-ray coplanar multiple SRMS diffractometry. The theory takes into account the properties of synchrotron radiation as well as the features of diffraction of radiation in the monochromator crystals and the slit.
View Article and Find Full Text PDFA two-dimensional (2D) pure polarization pattern via four-beam polarization interferometry of circularly polarized beams is demonstrated both theoretically and experimentally. The polarization orientation of the interference pattern is recorded by an azobenzene photoalignment layer and transferred to liquid crystal (LC), enabling the fabrication of a 2D liquid crystal (LC) chiral structure. This structure behaves as a 2D LC polarization grating (LCPG) that can generate multiple polarization-selective diffraction beams of orthogonal polarization states with high efficiency.
View Article and Find Full Text PDFWant AI Summaries of new PubMed Abstracts delivered to your In-box?
Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!