Planar photonic chips with tailored angular transmission for high-contrast-imaging devices.

Nat Commun

Hefei National Laboratory for Physical Sciences at the Microscale, Advanced Laser Technology Laboratory of Anhui Province, Department of Optics and Optical Engineering, University of Science and Technology of China, 230026, Hefei, Anhui, China.

Published: November 2021

A limitation of standard brightfield microscopy is its low contrast images, especially for thin specimens of weak absorption, and biological species with refractive indices very close in value to that of their surroundings. We demonstrate, using a planar photonic chip with tailored angular transmission as the sample substrate, a standard brightfield microscopy can provide both darkfield and total internal reflection (TIR) microscopy images with one experimental configuration. The image contrast is enhanced without altering the specimens and the microscope configurations. This planar chip consists of several multilayer sections with designed photonic band gaps and a central region with dielectric nanoparticles, which does not require top-down nanofabrication and can be fabricated in a larger scale. The photonic chip eliminates the need for a bulky condenser or special objective to realize darkfield or TIR illumination. Thus, it can work as a miniaturized high-contrast-imaging device for the developments of versatile and compact microscopes.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8616932PMC
http://dx.doi.org/10.1038/s41467-021-27231-6DOI Listing

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