Single-path electro-optic coefficients measurement approach using multiple reflection interference.

An electro-optic coefficient (EOC) is an important optical property of optical crystals. In this work, a single-path multiple reflection interferometer is proposed to measure the components of signed EOCs with high precision. With the help of the normalization method, the influence of incident light was removed, and repeatability of the experimental results was improved. The signed EOCs of a congruent crystal were determined under a small external electric field as =+9.6±0.3/ and =+29.5±0.5/. This study may contribute to the development of potential anisotropic devices of optical crystals.