Measurement of interfacial properties between thin films and elastomers is investigated. As a prototype, the interface adhesion between a graphite nanoflake and an elastic polymer is determined by topography imaging of the induced graphite buckles using atomic force microscopy. A theoretical analysis is carried out to establish the relationship among interface adhesion, elastic strain energy, and buckle surface area. The strain energy of the graphite is obtained by employing an elastic plate deflection theory. To introduce the buckles, different methods are applied, including thermal contraction, bending, and stretching, and different substrate materials, namely, polydimethylsiloxane and polystyrene, are used. The uncertainty in measuring the interface adhesion is discussed. These investigations provide a promising approach to characterize the interfacial properties of multilayer samples.
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