Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt. | LitMetric
A small sample tilt away from a main zone axis orientation results in an elongation of the atomic columns in ADF STEM images. An often posed research question is therefore whether the ADF STEM image intensities of tilted nanomaterials should be quantified using a parametric imaging model consisting of elliptical rather than the currently used symmetrical peaks. To this purpose, simulated ADF STEM images corresponding to different amounts of sample tilt are studied using a parametric imaging model that consists of superimposed 2D elliptical Gaussian peaks on the one hand and symmetrical Gaussian peaks on the other hand. We investigate the quantification of structural parameters such as atomic column positions and scattering cross sections using both parametric imaging models. In this manner, we quantitatively study what can be gained from this elliptical model for quantitative ADF STEM, despite the increased parameter space and computational effort. Although a qualitative improvement can be achieved, no significant quantitative improvement in the estimated structure parameters is achieved by the elliptical model as compared to the symmetrical model. The decrease in scattering cross sections with increasing sample tilt is even identical for both types of parametric imaging models. This impedes direct comparison with zone axis image simulations. Nonetheless, we demonstrate how reliable atom-counting can still be achieved in the presence of small sample tilt.
Polymer design requires fine control over syntheses and a thorough understanding of their macromolecular structure. Herein, near-atomic level imaging of polymers is achieved, enabling the precise determination of one of the most important macromolecular characteristics: molecular weight. By judiciously designing and synthesizing different linear metal(loid)-rich homopolymers, subnanoscale polymer imaging is achieved through annular dark field-scanning transmission electron microscopy (ADF-STEM), owing to the incorporation of high atoms in the side chain of the monomeric units.
In this work, we present a method for direct, site-selective growth of tellurium nanowires by electrochemical deposition. The Te nanowires were grown laterally between two specially designed nanoband electrodes across a gap, and over a dielectric material, forming a lateral device structure directly. The resulting wires are crystalline and phase pure, as evidenced by Raman spectroscopy, EDS (energy dispersive X-ray spectroscopy), and ADF-STEM (annular dark field scanning transmission electron microscopy).
Objectives: to assess the cytotoxicity of the following functional monomers used in dental adhesives: 10-Methacryloyloxydecyl dihydrogen phosphate (10-MDP) and glycerol phosphate dimethacrylate (GPDM), and their effect on cytokine release from human dental pulp stem cells (hDPSCs).
Methods: The hDPSCs cells were isolated from the dental pulp of extracted human third molars. The functional monomers, 10-MDP and GPDM, were diluted in dimethyl sulfoxide (DMSO) at concentrations ranging from 1 to 4 mM.
* Aberration-corrected scanning transmission electron microscopy (STEM) has advanced rapidly and is used for detailed atomic-scale characterization, but it faces challenges in analyzing signals from individual atoms.
* This review highlights low-voltage STEM methods with single-atom sensitivity, showcasing carbon-based nanomaterials for their unique stability and properties, while also summarizing recent advancements and future prospects in this field.
