Temperature dependencies of the refractive index for Al-Ga-In-As metamorphic layers.

Temperature dependencies of the refractive indices, , for and metamorphic layers with =0.06-0.25 have been determined. For this purpose, we performed variable-temperature (80 to 400 K) measurements of the specular reflection coefficient using custom distributed-Bragg-reflector structures in the spectral range from 0.8 µm to 2.2 µm. All the compositions exhibited a nearly linear temperature dependence of . For , the temperature coefficient (/) increases from 2.0⋅10 for =0.06 to 4.5⋅10 at =0.25. In turn, the temperature coefficient of the refractive index stays at the level of (1.7-2.0)⋅10 at the considered indium contents.