Operation of Josephson electronics usually requires determination of the Josephson critical current Ic, which is affected both by fluctuations and measurement noise. Lock-in measurements allow obviation of 1/f noise, and therefore, provide a major advantage in terms of noise and accuracy with respect to conventional dc measurements. In this work we show both theoretically and experimentally that the Ic can be accurately extracted using first and third harmonic lock-in measurements of junction resistance. We derived analytical expressions and verified them experimentally on nano-scale Nb-PtNi-Nb and Nb-CuNi-Nb Josephson junctions.
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| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8398034 | PMC |
| http://dx.doi.org/10.3390/nano11082058 | DOI Listing |
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