Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3122
Function: getPubMedXML
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
For minor metal recycling from electric parts, detachment without breakage (non-destructive detachment) of the electric parts from printed circuit boards (PCBs) is required. A cross-flow shredder (CFS), a drum-type chain mill, is often used in PCB recycling, but the effects of its individual features (e.g., chain thickness) on the non-destructive detachment of the PCB parts have yet to be understood. In this study, a CFS suited to the design-of-experiment (DoE) approach was developed; 27 different experimental conditions were evaluated, with three repetitions under each condition for a single PCB crushing, and the effect of nine CFS factors on the non-destructive detachment of parts from the PCBs of mobile phones was investigated. It was revealed that two factors (rotation rate and vent screen) have a statistically significant influence on such non-destructive detachment, and two other factors (chain-wall distance and crushing time) have a significant influence on related results such as the overcrushing of boards (PCBs after parts detachment) and powder generation. Based on these results, a future perspective on CFS improvement is presented.
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Source |
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http://dx.doi.org/10.1016/j.wasman.2021.08.010 | DOI Listing |
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