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Quantum Confined Stark Effect on the Linear and Nonlinear Optical Properties of SiGe/Si Semi Oblate and Prolate Quantum Dots Grown in Si Wetting Layer. | LitMetric

AI Article Synopsis

  • The study examines how parallel and perpendicular electric fields influence the optical and electronic properties of silicon-germanium (SiGe) quantum dots of different shapes, focusing on both prolate and oblate configurations.
  • Using numerical simulations and the effective-mass approximation, researchers analyzed various factors including dipole matrix elements, bandgap, and non-linear optical properties like absorption coefficients and harmonic generation.
  • Key findings indicate that increasing electric fields and wetting layer thickness cause a redshift in non-linear optical properties, while sensitivities to shape differences of the quantum dots are also reported, contributing valuable insights for future research in this area.

Article Abstract

We have studied the parallel and perpendicular electric field effects on the system of SiGe prolate and oblate quantum dots numerically, taking into account the wetting layer and quantum dot size effects. Using the effective-mass approximation in the two bands model, we computationally calculated the extensive variation of dipole matrix (DM) elements, bandgap and non-linear optical properties, including absorption coefficients, refractive index changes, second harmonic generation and third harmonic generation as a function of the electric field, wetting layer size and the size of the quantum dot. The redshift is observed for the non-linear optical properties with the increasing electric field and an increase in wetting layer thickness. The sensitivity to the electric field toward the shape of the quantum dot is also observed. This study is resourceful for all the researchers as it provides a pragmatic model by considering oblate and prolate shaped quantum dots by explaining the optical and electronic properties precisely, as a consequence of the confined stark shift and wetting layer.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8228555PMC
http://dx.doi.org/10.3390/nano11061513DOI Listing

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