The utility of mitochondrial cytochrome oxidase subunit I (COX1) and 16S ribosomal DNA (16S-rDNA) sequence analyses as a complementary/alternative tool to classical taxonomy, for the identification of some of the most prevalent hard tick species from Portugal was evaluated using BOLD-ID (COX1 only), BLASTn and phylogenetic tree reconstruction based on multiple nucleotide sequence alignments. Both molecular markers proved suitable for identifying ticks to a species level, but specific aspects that limit their resolving power must be considered. Their accuracy of tick identification in all life stages and of the other tick species described in the South of Europe is required.
Download full-text PDF |
Source |
---|---|
http://dx.doi.org/10.1016/j.vprsr.2021.100551 | DOI Listing |
Pathogens
January 2025
Facultad de Ciencias, Universidad Autónoma de Baja California, Ensenada 22860, BC, Mexico.
is the parasite responsible for Chagas disease, which has a significant amount of genetic diversification among the species complex. Many efforts are routinely made to characterize the genetic lineages of circulating in a particular geographic area. However, the genetic loci used to typify the genetic lineages of have not been consistent between studies.
View Article and Find Full Text PDFMicromachines (Basel)
December 2024
Institute of Information Science, Beijing Jiaotong University, Beijing 100044, China.
Reconfigurable processor-based acceleration of deep convolutional neural network (DCNN) algorithms has emerged as a widely adopted technique, with particular attention on sparse neural network acceleration as an active research area. However, many computing devices that claim high computational power still struggle to execute neural network algorithms with optimal efficiency, low latency, and minimal power consumption. Consequently, there remains significant potential for further exploration into improving the efficiency, latency, and power consumption of neural network accelerators across diverse computational scenarios.
View Article and Find Full Text PDFJ Am Soc Mass Spectrom
January 2025
MTA-ELTE Lendület (Momentum) Ion Mobility Mass Spectrometry Research Group, ELTE Eötvös Loránd University, Institute of Chemistry, Department of Analytical Chemistry, Pázmány Péter sétány 1/A, H-1117 Budapest, Hungary.
Cyclic ion mobility-mass spectrometry (cIM-MS) is a powerful technique for separating and identifying isomeric mixtures of compounds. When coupled with chromatography, cIM-MS creates a multidimensional separation system, with high resolving power and peak capacity. In this study, we report the cyclic ion mobility separation and high-resolution mass spectrometry identification of four regioisomers of a Sugammadex-related impurity, abbreviated as Di-OH-SGM.
View Article and Find Full Text PDFJ Hazard Mater
January 2025
CEREGE, CNRS, Aix Marseille Univ, IRD, INRAE, Aix-en-Provence, France; Civil and Environmental Engineering, Duke University, Durham, NC, United States.
Within the ITER project (International Thermonuclear Experimental Reactor) an international project building a magnetic confinement device to achieve fusion as a sustainable energy source, tungsten (W) is planned to serve as a plasma-facing component (PFC) in the tokamak, a magnetic confinement device used to produce controlled thermonuclear fusion power. Post plasma-W interactions, submicron tungsten particles can be released. This study investigated the exposure of lentic freshwater ecosystems to ITER-like tungsten nanoparticles in indoor aquatic mesocosms.
View Article and Find Full Text PDFSci Adv
January 2025
Guangdong Provincial Key Laboratory of Optical Fiber Sensing and Communications, Institute of Photonics Technology, Jinan University, Guangzhou 510632, China.
Artificial nanostructures with ultrafine and deep-subwavelength features have emerged as a paradigm-shifting platform to advanced light-field management, becoming key building blocks for high-performance integrated optoelectronics and flat optics. However, direct optical inspection of integrated chips remains a missing metrology gap that hinders quick feedback between design and fabrications. Here, we demonstrate that photothermal nonlinear scattering microscopy can be used for direct imaging and resolving of integrated optoelectronic chips beyond the diffraction limit.
View Article and Find Full Text PDFEnter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!