In this Letter, we propose a deep learning method with prior knowledge of potential aberration to enhance the fluorescence microscopy without additional hardware. The proposed method could effectively reduce noise and improve the peak signal-to-noise ratio of the acquired images at high speed. The enhancement performance and generalization of this method is demonstrated on three commercial fluorescence microscopes. This work provides a computational alternative to overcome the degradation induced by the biological specimen, and it has the potential to be further applied in biological applications.
Download full-text PDF |
Source |
---|---|
http://dx.doi.org/10.1364/OL.418997 | DOI Listing |
Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!