AI Article Synopsis
- The study investigates the electronic properties of bilayer graphene (BLG) using a scanning near-field optical microscopy (s-SNOM) technique, employing a tunable laser across a range of energies from 0.3 to 0.54 eV.
- By tuning a specific optical system around the interband resonance of BLG, researchers extract both the amplitude and phase of scattered light, allowing for detailed analysis of the optical conductivity.
- This innovative approach permits noncontact measurements at the nanoscale, making it suitable for studying complex two-dimensional materials where traditional methods like scanning tunneling spectroscopy might not reach certain layers.
Article Abstract
Here we directly probe the electronic properties of bilayer graphene using s-SNOM measurements with a broadly tunable laser source over the energy range from 0.3 to 0.54 eV. We tune an OPO/OPA system around the interband resonance of Bernal stacked bilayer graphene (BLG) and extract amplitude and phase of the scattered light. This enables us to retrieve and reconstruct the complex optical conductivity resonance in BLG around 0.39 eV with nanoscale resolution. Our technique opens the door toward nanoscopic noncontact measurements of the electronic properties in complex hybrid 2D and van der Waals material systems, where scanning tunneling spectroscopy cannot access the decisive layers.
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Source |
|---|---|
| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7976599 | PMC |
| http://dx.doi.org/10.1021/acsphotonics.0c01442 | DOI Listing |
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