Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3122
Function: getPubMedXML
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Polycrystalline higher manganese silicides MnCrSi ( = 0, 0.10, 0.20) with Cr single doping and MnCrFeSi ( = 0.10, 0.20) with Cr-Fe double doping have been prepared by arc melting and spark plasma sintering. Hall effect results and thermoelectric transport properties measurements demonstrate that Cr doping effectively increases the carrier concentration, thereby giving rise to enhanced electrical conductivity and power factor. Coupled with an enlarged effective mass and a reduction in the lattice thermal conductivity, a maximum is realized in MnCrSi. It is also proved that the carrier concentration and carrier scattering mechanism could be altered through further doping on the Mn site by Fe, which leads to a lower electrical conductivity and higher Seebeck coefficient. Factors related to the suppression of the lattice thermal conductivity, like mass and strain field fluctuation scattering and electron-phonon scattering, are also analyzed. This work reveals the effects of Cr single doping and Cr-Fe dual-element doping on the carrier concentration, carrier scattering mechanism, and lattice thermal conductivity of higher manganese silicides.
Download full-text PDF |
Source |
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http://dx.doi.org/10.1021/acsami.0c21484 | DOI Listing |
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