Terahertz time-domain spectroscopy (THz-TDS) was employed for estimation of intrinsic dielectric loss of ZrSnTiO (ZST) ceramics. Single-phase ZST dielectric resonators (DRs) with various synthesis parameters and, consequently, different extrinsic losses, were prepared by conventional ceramic technology. Even though the DRs exhibit a similar microstructure, their quality factor ( is the inverse of dielectric loss tangent) measured in microwave (MW) domain at 6 GHz varies between 2500 and 8400. On the other hand, it was found that the THz dielectric loss is less sensitive to the sample preparation. The intrinsic losses ( × ~60 THz) of the ZST ceramics have been derived from THz data.
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| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7794686 | PMC |
| http://dx.doi.org/10.3390/ma14010216 | DOI Listing |
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