Publisher's Note: "A constant-frequency feedback loop for non-contact frequency-modulated atomic force microscopy via root locus: Implemented on a single-board field-programmable gate array device" [Rev. Sci. Instrum. 91, 113702 (2020)].

Rev Sci Instrum

Department of Physics, Technion - Israel Institute of Technology, Haifa 3200003, Israel.

Published: December 2020

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http://dx.doi.org/10.1063/5.0037251	DOI Listing

Publication Analysis

publisher's note

note constant-frequency

constant-frequency feedback

feedback loop

loop non-contact

non-contact frequency-modulated

frequency-modulated atomic

atomic force

force microscopy

microscopy root

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