Fast-ion-induced secondary ion emission from submicron droplet surfaces studied using a new coincidence technique with forward-scattered projectiles.

A mass spectrometric study of secondary ions emitted from droplet surfaces by MeV-energy heavy ion impact was performed to investigate fast-ion-induced molecular reaction processes on liquid surfaces. Herein, a new coincidence technique was developed between secondary ions and scattered projectile ions at a small forward angle. The advantages of this technique were demonstrated by measurement of the collision between 4-MeV C and ethanol droplets. Secondary ion emission probabilities were obtained directly from the coincidence data. Notably, this technique enabled positive fragment ions that had not been identified in previous measurements to be observed by suppressing the strong background originating from gas-phase molecules more than 10-fold. H, HO, CH , and CHO were found to be produced as major positive fragment ions, in addition to minor fragments H , CH , and CHOH. Production of these ions suggests that competition between rapid hydrogen ion emission from multiply ionized states and intermolecular proton transfer accompanied by fragmentation through protonated ethanol occurs after fast heavy-ion collisions. Clarification of the positive fragment ions also revealed the characteristic features of negative ions. Negative ions were realized to exhibit higher degrees of fragmentation and reactivity compared with positive ions. Furthermore, the energy loss by forward-scattered ions during droplet penetration was used to evaluate the target thickness at a submicron level. Variations in secondary ion yield, mass distribution, and kinetic energies depending on the penetration length were observed below 1 µm. These results highlight the unknown mechanism of these "submicron effects" observed in secondary ion emission processes as a new phenomenon.