Phase imaging dislocations using diffracted beam interferometry.

Microscopy (Oxf)

CAMTEC, Mechanical Engineering (MENG), University of Victoria, Victoria, BC, Canada, V8W 2Y2.

Published: June 2021

A phase imaging method that measures the phase shift existing at a dislocation's core is described. The method uses the interference of two symmetrically diffracted beams on the optic axis by means of an electron biprism. Each diffracted beam carries half the phase of the dislocation core. When combined, the entire phase shift of the dislocation core is obtained.

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Source
http://dx.doi.org/10.1093/jmicro/dfaa066DOI Listing

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