AI Article Synopsis

  • The study focuses on the energy band alignment between CdS (n-type) and CuZnSnS (CZTS, p-type) solar cell materials, particularly how Ag alloying affects this interface and overall efficiency.
  • Ag alloying reduces defects in bulk CZTS, but its impact on the interface with CdS has not been well explored until now, using techniques like ultraviolet and X-ray photoelectron spectroscopy to analyze changes.
  • Results show significant shifts in electronic properties at the interface, revealing a cliff-like band alignment and indicating larger charge depletion widths with Ag alloying, which opens up new potential for future optoelectronic device applications.

Article Abstract

Energy band alignment at the heterointerface between CdS and kesterite CuZnSnS (CZTS) and its alloys plays a crucial role in determining the efficiency of the solar cells. Whereas Ag alloying of CZTS has been shown to reduce anti-site defects in the bulk and thus rise the efficiency, the electronic properties at the interface with the CdS buffer layer have not been extensively investigated. In this work, we present a detailed study on the band alignment between n-CdS and p-CZTS upon Ag alloying by depth-profiling ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS). Our findings indicate that core-level peaks and the valence band edge of CdS exhibit a significant shift to a lower energy (larger than 0.4 eV) upon the etching of the CdS layer, which can be assigned due to band bending and chemical shift induced by a change in the chemical composition across the interface. Using a simplified model based on charge depletion layer conservation, a significantly larger total charge region depletion width was determined in Ag-alloyed CZTS as compared to its undoped counterpart. Our findings reveal a cliff-like band alignment at both CdS/CZTS and CdS/Ag-CZTS heterointerfaces. However, the conduction-band offset decreases by more than 0.1 eV upon Ag alloying of CZTS. The approach demonstrated here enables nanometer-scale depth profiling of the electronic structure of the p-n junction and can be universally applied to study entirely new platforms of oxide/chalcogenide heterostructures for next-generation optoelectronic devices.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7591932PMC
http://dx.doi.org/10.1038/s41598-020-73828-0DOI Listing

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