Unitary matrix approach for a precise voltage dependent characterization of reflective liquid crystal devices by average Stokes polarimetry.

Precise characterization of parallel-aligned liquid crystal on silicon microdisplays has an important impact in many advanced photonics applications. We show liquid crystal on silicon (LCoS) modeled as a non-absorbent reciprocal device. Combined with time-average Stokes polarimetry, LCoS enables us to demonstrate robust measurements across the whole applied voltage range for the retardance and its flicker, and also as a novelty for the director orientation. We obtain that the director orientation changes across the voltage range, especially at larger applied voltages. This is a small effect, but it may provide a deeper insight into the internal dynamics in the liquid crystal layer, and in sensitive phase-only applications will produce a coupling between amplitude and phase.