AI Article Synopsis
- The study focuses on the rapid changes in X-ray emission spectra of iron when exposed to high-intensity X-rays from a free electron laser, observed within femtoseconds (fs).
- Measurements showed that significant shifts and broadening in the spectra began within just 10 fs of X-ray exposure, indicating fast electronic reactions.
- These findings highlight the importance of understanding quick electronic processes during XFEL experiments, potentially affecting how researchers conduct 'probe-before-destroy' measurements for studying electronic structures.
Article Abstract
We report the time-resolved femtosecond evolution of the K-shell X-ray emission spectra of iron during high intensity illumination of X-rays in a micron-sized focused hard X-ray free electron laser (XFEL) beam. Detailed pulse length dependent measurements revealed that rapid spectral energy shift and broadening started within the first 10 fs of the X-ray illumination at intensity levels between 10 and 10 W cm. We attribute these spectral changes to the rapid evolution of high-density photoelectron mediated secondary collisional ionization processes upon the absorption of the incident XFEL radiation. These fast electronic processes, occurring at timescales well within the typical XFEL pulse durations (i.e., tens of fs), set the boundary conditions of the pulse intensity and sample parameters where the widely-accepted 'probe-before-destroy' measurement strategy can be adopted for electronic-structure related XFEL experiments.
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| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC7545180 | PMC |
| http://dx.doi.org/10.1038/s41598-020-74003-1 | DOI Listing |
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