Enabling time-resolved 2D spatial-coherence measurements using the Fourier-analysis method with an integrated curved-grating beam monitor.

Direct 2D spatial-coherence measurements are increasingly gaining importance at synchrotron beamlines, especially due to present and future upgrades of synchrotron facilities to diffraction-limited storage rings. We present a method to determine the 2D spatial coherence of synchrotron radiation in a direct and particularly simple way by using the Fourier-analysis method in conjunction with curved gratings. Direct photon-beam monitoring provided by a curved grating circumvents the otherwise necessary separate determination of the illuminating intensity distribution required for the Fourier-analysis method. Hence, combining these two methods allows for time-resolved spatial-coherence measurements. As a consequence, spatial-coherence degradation effects caused by beamline optics vibrations, which is one of the key issues of state-of-the-art X-ray imaging and scattering beamlines, can be identified and analyzed.