Small perturbation techniques have proven to be useful tools for the investigation of perovskite solar cells. A correct interpretation of the spectra given by impedance spectroscopy (IS), intensity-modulated photocurrent spectroscopy (IMPS), and intensity-modulated photovoltage spectroscopy (IMVS) is key for the understanding of device operation. The utilization of a correct equivalent circuit to extract real parameters is essential to make this good interpretation. In this work, we present an equivalent circuit, which is able to reproduce the general and the exotic behaviors found in impedance spectra. From the measurements, we demonstrate that the midfrequency features that may appear to depend on the active layer thickness, and we also prove the spectral correlation of the three techniques that has been suggested theoretically.
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| http://dx.doi.org/10.1021/acs.jpclett.0c02459 | DOI Listing |
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