Two-dimensional molybdenum disulfide (MoS) is an emergent semiconductor with great potential in next-generation scaled-up electronics, but the production of high-quality monolayer MoS wafers still remains a challenge. Here, we report an epitaxy route toward 4 in. monolayer MoS wafers with highly oriented and large domains on sapphire. Benefiting from a multisource design for our chemical vapor deposition setup and the optimization of the growth process, we successfully realized material uniformity across the entire 4 in. wafer and greater than 100 μm domain size on average. These monolayers exhibit the best electronic quality ever reported, as evidenced from our spectroscopic and transport characterizations. Our work moves a step closer to practical applications of monolayer MoS.
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http://dx.doi.org/10.1021/acs.nanolett.0c02531 | DOI Listing |
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