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Preferential self-healing at grain boundaries in plasma-treated graphene. | LitMetric

Preferential self-healing at grain boundaries in plasma-treated graphene.

Nat Mater

Département de Physique, Université de Montréal, Montréal, Québec, Canada.

Published: January 2021

AI Article Synopsis

  • The study focuses on how defects in grains and grain boundaries affect the performance of functional materials, particularly in low-dimensional materials like graphene.
  • Using hyperspectral Raman imaging, researchers investigated how low-energy ion bombardment damages a polycrystalline graphene film, revealing different defect generation patterns in grains versus domain boundaries.
  • Findings indicate that defect generation is slower at grain boundaries due to self-healing processes, highlighting the intricate behaviors of structural recovery and defect migration in two-dimensional materials.

Article Abstract

Engineering of defects located in grains or at grain boundaries is central to the development of functional materials. Although there is a surge of interest in the formation, migration and annihilation of defects during ion and plasma irradiation of bulk materials, these processes are rarely assessed in low-dimensional materials and remain mostly unexplored spectroscopically at the micrometre scale due to experimental limitations. Here, we use a hyperspectral Raman imaging scheme providing high selectivity and diffraction-limited spatial resolution to examine plasma-induced damage in a polycrystalline graphene film. Measurements conducted before and after very low-energy (11-13 eV) ion bombardment show defect generation in graphene grains following a zero-dimensional defect curve, whereas domain boundaries tend to develop as one-dimensional defects. Damage generation is slower at grain boundaries than within the grains, a behaviour ascribed to preferential self-healing. This evidence of local defect migration and structural recovery in graphene sheds light on the complexity of chemical and physical processes at the grain boundaries of two-dimensional materials.

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Source
http://dx.doi.org/10.1038/s41563-020-0738-0DOI Listing

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