Severity: Warning
Message: file_get_contents(https://...@pubfacts.com&api_key=b8daa3ad693db53b1410957c26c9a51b4908&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 176
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 176
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 250
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 1034
Function: getPubMedXML
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3152
Function: GetPubMedArticleOutput_2016
File: /var/www/html/application/controllers/Detail.php
Line: 575
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 489
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 316
Function: require_once
Modeling charge transport across material interfaces is important for understanding the limitations of electronic devices such as transistors, electrochemical cells, sensors, and batteries. However, modeling the entire structure and full dimensionality of an interface can be computationally demanding. In this study, we investigate the validity of an efficient reduced one-dimensional Hamiltonian for calculating charge transport along interfaces by comparing to a two-dimensional model that accounts for additional charge transport pathways. We find that the one-dimensional model successfully predicts the qualitative trend of charge transmission probability among Pt/FeO and Ag/FeO interfaces. However, the two-dimensional model provides additional information on possible pathways that are not perpendicular to the interface direction. These charge transport pathways are directed along the lowest potential energy profile of the interface that correlates with the crystal structure of the constituting materials. However, the two-dimensional paths are longer and take more scattering time. Therefore, the one-dimensional model may hold sufficient information for qualitative estimation of charge transport through some material interfaces.
Download full-text PDF |
Source |
---|---|
http://dx.doi.org/10.1063/5.0006273 | DOI Listing |
Enter search terms and have AI summaries delivered each week - change queries or unsubscribe any time!